2053863
9780521453738
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.Ichimiya, Ayahiko is the author of 'Reflection High-Energy Electron Diffraction', published 2004 under ISBN 9780521453738 and ISBN 0521453739.
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