Name: Semiconductor Device and Failure Analysis Using Photon Emission Microscopy
Author: Chim, Wai Kin
ISBN: 9780471492405

by Chim, Wai Kin

Semiconductor Device and Failure Analysis Using Photon Emission Microscopy

by Chim, Wai Kin

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ISBN-13: 9780471492405
ISBN: 047149240X
Publisher: Wiley & Sons, Incorporated, John

AUTHOR

Chim, Wai Kin

SUMMARY

Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.Chim, Wai Kin is the author of 'Semiconductor Device and Failure Analysis Using Photon Emission Microscopy' with ISBN 9780471492405 and ISBN 047149240X.

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