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Publication Date: 2007
Publisher: Springer-Verlag New York, LLC
Fultz, Brent, Howe, James M.
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.Fultz, Brent is the author of 'Transmission Electron Microscopy and Diffractometry of Materials', published 2007 under ISBN 9783540738855 and ISBN 3540738851.
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