6032989
9783540738855
Transmission Electron Microscopy and Diffractometry of Materials
by Fultz, Brent, Howe, James M.
5789
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- Comments: 100% BRAND NEW US Edition / Mint condition / Never been read / still shrink wrapped/ HARDCOVER/STUDENT Edition / 3rd Edition /ISBN: 3540738851. Shipped out in one business day with free tracking.
72212
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- Comments: IMP: Acceptable- Do not include ACCESS CODE, CD-ROM or companion materials even if stated in item title. It may contain highlighting/markings throughout, and the covers and corners may show shelf wear. Corners, pages may be dent. All text is legible. 27
Product details
- ISBN-13: 9783540738855
- ISBN: 3540738851
- Publication Date: 2007
- Publisher: Springer-Verlag New York, LLC
AUTHOR
SUMMARY
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.Fultz, Brent is the author of 'Transmission Electron Microscopy and Diffractometry of Materials', published 2007 under ISBN 9783540738855 and ISBN 3540738851.
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