Comments: Buy with confidence. Excellent Customer Service & Return policy. Ships Fast. 24*7 Customer Service.
30-day money back guarantee
Publication Date: 2001
Publisher: Springer Verlag
James M. Howe, B. Fultz, Brent Fultz
This introduction presents the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM.James M. Howe is the author of 'Transmission Electron Microscopy and Diffractometry of Materials', published 2001 under ISBN 9783540678410 and ISBN 3540678417.
With our dedicated customer support team, 30-day no-questions-asked return policy, and our price match guarantee, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.
Book condition guidelines
New (perfect condition)
Pages are clean and are not marked by notes, highlighting or fold.
Like new (excellent condition)
Pages are clean and are not marked by notes, highlighting or folds.
Very good (good condition)
Pages are intact and may have minimal notes and/or highlighting or folds.
Good (clean condition)
All pages and the cover is intact. The spine may show signs of wear. Pages include notes and/or highlighting.
Acceptable (readable condition)
All pages and the cover is intact. Pages include considerable notes in pen or highlighter, but the text is not obscured.
How do rentals work?
Save up to 90% on the largest selection of textbook rentals in the business. We have the lowest prices - guaranteed.
Choose between standard or expedited shipping to make sure that your textbooks arrive in time for class.
Return for free!
When your books are due, just pack them up and ship them back. And don't worry about shipping - it's absolutely free!