154929

9780306472923

Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
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  • Comments: 2007. 3rd. Hardcover. An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Num Pages: 690 pages, biography. BIC Classification: PDND; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 259 x 185 x 35. Weight in Grams: 1694. . . . . . We ship daily from our Bo

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  • ISBN-13: 9780306472923
  • ISBN: 0306472929
  • Edition: 3
  • Publisher: Kluwer Academic Pub

AUTHOR

SUMMARY

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology.Goldstein, Joseph is the author of 'Scanning Electron Microscopy and X-Ray Microanalysis' with ISBN 9780306472923 and ISBN 0306472929.

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