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Publisher: Kluwer Academic Pub
Goldstein, Joseph, Echlin, Patrick, Joy, David C.
Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology.Goldstein, Joseph is the author of 'Scanning Electron Microscopy and X-Ray Microanalysis' with ISBN 9780306472923 and ISBN 0306472929.