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9780471920465
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Parameter Tolerance Design for Electrical Circuits (A. Ilumoka & R. Spence). A Methodology for Planning Experiments in Robust Product and Process Design (A. Shoemaker & R. Kacker). Optimization of Product and Process Design for Quality and Cost (M. Phadke & K. Dehnad). Strategies for Planning Experiments Using Orthogonal Arrays and Confounding Tables (K.-L. Tsui). An Explanation and Critique of Taguchi2s Contributions to Quality Engineering (G. Box, et al.). Signal-to-Noise Ratio Development for Quality Engineering (K. Kapur & G. Chen). Better than Taguchi Orthogonal Tables (D. Shainin & P. Shainin). Use of 2 k-p Designs in Parameter Design (J. Song & J. Lawson). Characterizing and Optimizing Multi-Response Processes by the Taguchi Method (N. Logothetis & A. Haigh). Application of Taguchi Methods to Surface Mount Processes (G. Bandurek, et al.) Worst Case Product Performance Verification with Electromagnetic Interference Test Applications (F. Breyfogle & J. Davis). Estimating the Error of an Effect in Unreplicated 2-Level Fractional Factorial Designs (W. Wang & J. Lawson). Annotated Bibliography of Books on Experimental Design (G. Hahn). Book Reviews. News Digest. International Calendar of Forthcoming Events.Harris, Norman C. is the author of 'Quality and Reliability Engineering International', published 1988 under ISBN 9780471920465 and ISBN 0471920460.
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