1381734
9780750302036
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This important textbook provides a comprehensive description of the large range of techniques used to characterize the microstructure of materials. The book carefully explains the interactions between various radiations with materials, and shows how these interactions form the basis of the specific evaluation and measurement methods. Sections of the text deal with basic science and technology, such as diffraction laws, vacuum techniques and radiation sources.The characterization techniques are divided on the basis of the interrogating radiation source, and cover optical and x-ray techniques, electron microscopy and spectroscopy, ion and particle microscopy and spectroscopy. Computer applications in instrument control, data acquisition and analysis are discussed, together with coverage of simulation techniques.Flewitt, P. E. is the author of 'Physical Methods for Materials Characterisation' with ISBN 9780750302036 and ISBN 0750302038.
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