131500

9780073037486

Map Use & Analysis

Map Use & Analysis
$143.45
$3.95 Shipping
  • Condition: New
  • Provider: gridfreed Contact
  • Provider Rating:
    0%
  • Ships From: San Diego, CA
  • Shipping: Standard
  • Comments: New. In shrink wrap. Looks like an interesting title!

seal   30-day money back guarantee
$2.31
$3.95 Shipping
List Price
$83.61
Discount
97% Off
You Save
$81.30

  • Condition: Good
  • Provider: gwspokanebooks Contact
  • Provider Rating:
    94%
  • Ships From: Spokane, WA
  • Shipping: Standard
  • Comments: STUDENT edition textbook. There may be writing, stickers or sticker residue on the cover. The cover has some markings, dings, and wear. Creasing, curling, or bending of the covers. The pages show little markings, dings and wear. Pages have some folded corners.

seal   30-day money back guarantee

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9780073037486
  • ISBN: 0073037486
  • Edition: 4
  • Publication Date: 2000
  • Publisher: McGraw-Hill Science/Engineering/Math

AUTHOR

John Campbell

2 Customer Product Reviews

SUMMARY

John Campbell is the author of 'Map Use & Analysis', published 2000 under ISBN 9780073037486 and ISBN 0073037486.

[read more]

Average customer review

2 Customer Product Reviews

5 Star
60% Complete
4 Star
40% Complete
3 Star
30% Complete
2 Star
10% Complete
1 Star
00% Complete
 By {{post.name|unescape}}

{{post.questionOneAnswer|unescape}} {{post.questionTwoAnswer|unescape}}

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.