Atomic Force Microscopy/Scanning Tunneling Microscopy 3

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.Cohen, Samuel H. is the author of 'Atomic Force Microscopy/Scanning Tunneling Microscopy 3' with ISBN 9780306462979 and ISBN 0306462974.