Atomic Force Microscopy in Adhesion Studies

More than 20 years have passed since the invention of Scanning Probe Microscopy (SPM), an analytical tool that has accelerated research in science and all engineering disciplines. Several major techniques can be classified under SPM, of which Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. AFM instruments are used for imaging and characterization of surfaces and interfaces, and studying surface/interfacial phenomena, including adhesion phenomena. This volume contains the papers on AFM techniques, as previously published in three special issues of the Journal of Adhesion Science and Technology: Application of Scanning Probe Microscopy in Interfacial Phenomena.Drelich, J. is the author of 'Atomic Force Microscopy in Adhesion Studies ', published 2005 under ISBN 9789067644341 and ISBN 906764434X.