Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis

A Special Issue of the Journal of Research of the Nat. Institute of Standards & Technology (NIST). Electron probe x-ray microanalysis (EPMA) is one of the oldest yet still one of the most widely applied methods of spatially-resolved elemental analysis. Leading experts in EPMA from industry, academia, & government, from the U.S., Canada, Mexico, & Europe met at NIST, April 8-11, 2002, to participate in a workshop on The Accuracy Barrier in Quantitative EPMA & the Role of Standards,Ó Co-sponsored by the Surface & Microanalysis Science Div. of the Chemical Science & Technology Lab. & the Microbeam Analysis Soc. (U.S.). This illustrated volume contains 19 papers from that workshop.Vorburger, Theodore V. is the author of 'Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis', published 2003 under ISBN 9780756735296 and ISBN 0756735297.