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Transmission Electron Microscopy and Diffractometry of Materials

Author: 


ISBN-13: 

9783540738855


ISBN: 

3540738851


Pub Date: 
Publisher:  Springer-Verlag New York, LLC
Summary: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.

Fultz, Brent is the author of Transmission Electron Microscopy and Diffractometry of Materials, publishe...d 2007 under ISBN 9783540738855 and 3540738851. Three Transmission Electron Microscopy and Diffractometry of Materials textbooks are available for sale on ValoreBooks.com, one used from the cheapest price of $71.68, or buy new starting at $279.95. [read more]

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Transmission Electron Microscopy and Diffractometry of Materials

ISBN-13: 9783540738855


ISBN: 3540738851


Pub Date:
Publisher: Springer-Verlag New York, LLC
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