Transmission Electron Microscopy and Diffractometry of Materials
Author:Fultz, Brent, Howe, James M.
ISBN-13:
9783540738855
ISBN:
3540738851
Pub Date: 2007
Publisher: Springer-Verlag New York, LLC
Summary: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.
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ISBN-13:
ISBN:
Pub Date: 2007
Publisher: Springer-Verlag New York, LLC
9783540738855
ISBN:
3540738851
Pub Date: 2007
Publisher: Springer-Verlag New York, LLC
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