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Transmission Electron Microscopy and Diffractometry of Materials

Author: 


ISBN-13: 

9783540437642


ISBN: 

3540437649


Edition:  2
Pub Date: 
Publisher:  Springer
Summary: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simpl...e citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Fultz, Brent is the author of Transmission Electron Microscopy and Diffractometry of Materials, published 2005 under ISBN 9783540437642 and 3540437649. Eleven Transmission Electron Microscopy and Diffractometry of Materials textbooks are available for sale on ValoreBooks.com, six used from the cheapest price of $94.97, or buy new starting at $122.84.
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Transmission Electron Microscopy and Diffractometry of Materials

ISBN-13: 9783540437642


ISBN: 3540437649


Edition: 2nd


Pub Date:
Publisher: Springer
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