Scanning Electron Microscopy and X-Ray Microanalysis
Author:Goldstein, Joseph, Echlin, Patrick, Joy, David C.
ISBN-13:
9780306472923
ISBN:
0306472929
Edition: 3
Publisher: Kluwer Academic Pub
Summary: Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology.
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