30-Day No-Hassle Returns
We guarantee your satisfaction on every purchase or rental with a full refund within 30 days of your purchase date.
Fast Customer Service
If you need help, our friendly customer service team is here to help!
The Best Prices on Textbook Rentals, Guaranteed
You can shop with confidence with the best rental prices at ValoreBooks.com. If you find a lower priced rental, we will match it.

Scanning Auger Electron Microscopy

Author: 


ISBN-13: 

9780470866771


ISBN: 

0470866772


Pub Date: 
Publisher:  Wiley & Sons, Incorporated, John
Summary: This book concentrates upon a form of scanning electron microscopy in which electrons are focused onto the surface of a solid sample and Auger electrons are emitted into an energy analyzer in which their kinetic energy is established.Following an introductory chapter setting the scene on the topic, chapters 2 and 3 are concerned respectively with the theory of the Auger process and the instrumentation needed in Auger... microscope. Chapters 4 and 5 discuss the limits to the spatial resolution of the microscopy and the methods used to separate the chemical information in an Auger image from potentially confusing effects (referred to as imaging artefacts) due to other properties of the sample, the experimental geometry employed or the methods used for collecting or displaying the data. Chapter 6 presents the software tools useful to interpret the information in an Auger image. Chapter 7 discussed methods that can convert the intensities of the pixels in a set of images using different Auger peaks from the same area of a sample into a set of maps revealing the atomic concentrations at each point in the surface - image quantification. Chapters 8 and 9 describe some of the most important applications of Auger microscopy in the fields of metallurgy and of semiconductor device characterization.The material in the book is intended as a guide to the subject of Auger electron microscopy and so it is hoped that it will be of interest to researchers in this field as well as to others who wish to discover what can be achieved with this technique and what are its limitations. In addition, it will be useful to analysts working with SAMs who are hard pressed to measure many samples and have little time to work on other aspects of the behaviour of their instrument or the problems that they may, perhaps unwittingly encounter.

El Gomati, Mohamed M. is the author of Scanning Auger Electron Microscopy, published 2006 under ISBN 9780470866771 and 0470866772. One hundred thirty two Scanning Auger Electron Microscopy textbooks are available for sale on ValoreBooks.com, fifty two used from the cheapest price of $130.21, or buy new starting at $25.73.
 [read more]

Marketplace Prices
80 New from $25.73 52 Used from $130.21
  • Used $130.21
  • New $25.73
Price + Shipping
Condition
Details
Product Details
Scanning Auger Electron Microscopy

ISBN-13: 9780470866771


ISBN: 0470866772


Pub Date:
Publisher: Wiley & Sons, Incorporated, John
Valore Books is the smartest bookstore for cheap Scanning Auger Electron Microscopy rentals, or new and used copies ready to be shipped fast.
Where's My Stuff?
Shipping & Returns