Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.R. W. Gould is the author of 'Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)', published 1995 under ISBN 9780824795542 and ISBN 0824795547.