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Introduction to Scanning Tunneling Microscopy - Julian Julian Chen - Hardcover

Author: 


ISBN-13: 

9780195071504


ISBN: 

0195071506


Publisher:  Oxford University Press, Incorporated
Summary: Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and present...s much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Chen, C. Julian is the author of Introduction to Scanning Tunneling Microscopy - Julian Julian Chen - Hardcover, published under ISBN 9780195071504 and 0195071506. Ninety two Introduction to Scanning Tunneling Microscopy - Julian Julian Chen - Hardcover textbooks are available for sale on ValoreBooks.com, one used from the cheapest price of $38.39, or buy new starting at $112.63.
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Introduction to Scanning Tunneling Microscopy - Julian Julian Chen - Hardcover

ISBN-13: 9780195071504


ISBN: 0195071506


Publisher: Oxford University Press, Incorporated
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