Failure Mechanisms in Semiconduct.dev.
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ISBN-13:
9780471914341
ISBN:0471914347
Publisher: Wiley & Sons, Incorporated, John Summary: Reliability Theory. Failure Mechanisms. Extrinsic Failure Mechanisms. Failure Mechanisms and Device Technologies. Packing. Screening. Accelerated Testing. Physical Failure Analysis Techniques. Reliability Prediction and Failure Modelling. Quality Assurance. Conclusions. Appendixes.
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ISBN-13:
ISBN:
Publisher: Wiley & Sons, Incorporated, John
9780471914341
ISBN:
0471914347
Publisher: Wiley & Sons, Incorporated, John
Reliability Theory. Failure Mechanisms. Extrinsic Failure Mechanisms. Failure Mechanisms and Device Technologies. Packing. Screening. Accelerated Testing. Physical Failure Analysis Techniques. Reliability Prediction and Failure Modelling. Quality Assurance. Conclusions. Appendixes.
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