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Defect analysis in electron microscopy






Publisher:  Wiley & Sons, Incorporated, John
Summary: Loretto, M. H. is the author of Defect analysis in electron microscopy, published under ISBN 9780470547601 and 047054760X. Three Defect analysis in electron microscopy textbooks are available for sale on ValoreBooks.com, and three used from the cheapest price of $0.40.

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ISBN-13: 9780470547601

ISBN: 047054760X

Publisher: Wiley & Sons, Incorporated, John
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