30-Day No-Hassle Returns
We guarantee your satisfaction on every purchase or rental with a full refund within 30 days of your purchase date.
Fast, Same-Day Customer Service
If you need help, our friendly, helpful Customer Service team will contact you the same business day.
The Best Prices on Textbook Rentals, Guaranteed
You can shop with confidence with the best rental prices at ValoreBooks.com. If you find a lower priced rental, we will match it.

Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation

by

Lodini, Alain, Fitzpatrick, Michael

$221.95 $3.95 Shipping
Item Details
Condition: New Seller: Rating: (868) 81% Ships From: Multiple Locations Shipping: Standard Comments: Please allow 4-14 business
days for Media Mail
delivery. Brand New,
Perfect Condit... [more]
Please allow 4-14 business
days for Media Mail
delivery. Brand New,
Perfect Condition, 100%
Money Back Guarantee, Over
1,000,000 customers served [less]
Marketplace Prices
1 Usedfrom $221.95
3 Newfrom $221.95
Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation, ISBN 9780415303972 Own This Book? Sell It
ISBN-13:

9780415303972

ISBN:

0415303974

Publisher: C R C Press LLC Summary: Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the theoretical basis of stress analysis by diffraction methods, the pract [read more]
THE EXTRA MILE GUARANTEE
  • 30-Day No-Hassle Returns
  • Fast, Same-Day Customer Service
  • The Best Prices on Textbook Rentals
Read More
NEED HELP PAYING FOR COLLEGE?
  • Find student loan options quickly and easily
  • Compare loans to find the best fit for you
  • Apply for the loan that meets your needs
Find Loan
Price + Shipping
Condition
Details
$221.95
+ $3.95 shipping
LOW ITEM PRICE
Used
Like New
  • Seller: Super Book Deals
  • Seller Rating: (868) 81%
  • Ships from: Multiple Locations
  • Shipping Methods: Standard
  • Comments: Please allow 4-14 business days for Media Mail delivery. Brand New, Perfect Condition, 100% Money Back Guarantee, Over 1,000,000 customers served
  • Contact seller about this item
QUANTITY

99+ In-Stock
$221.95
+ $3.95 shipping
LOW ITEM PRICE
New
  • Seller: Super Book Deals
  • Seller Rating: (868) 81%
  • Ships from: Multiple Locations
  • Shipping Methods: Standard
  • Comments: Please allow 4-14 business days for Media Mail delivery. Brand New, Perfect Condition, 100% Money Back Guarantee, Over 1,000,000 customers served
  • Contact seller about this item
QUANTITY

99+ In-Stock
$256.93
+ $3.95 shipping
New
QUANTITY

3 In-Stock
$299.82
+ $3.95 shipping
New
QUANTITY

1 In-Stock
Product Details
ISBN-13:

9780415303972


ISBN:

0415303974


Publisher: C R C Press LLC

Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the theoretical basis of stress analysis by diffraction methods, the practical implementation of the methods, and examples of key areas of application. Applications include the determination of internal stresses in weldments, in composite materials, following shot peening, and in ceramics. Discussions include problems in making measurements on textured samples.

Where's My Stuff?
Shipping & Returns