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38664260

9781475790290

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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Product details

  • ISBN-13: 9781475790290
  • ISBN: 1475790295
  • Edition: Softcover reprint of the original 1st ed. 1986
  • Publication Date: 2013
  • Publisher: Springer

AUTHOR

Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

SUMMARY

Patrick Echlin is the author of 'Advanced Scanning Electron Microscopy and X-Ray Microanalysis', published 2013 under ISBN 9781475790290 and ISBN 1475790295.

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