Advances in Imaging and Electron Physics, Volume 123: Advances in Electron Microscopy and Diffraction

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Peter W. Hawkes is the author of 'Advances in Imaging and Electron Physics, Volume 123: Advances in Electron Microscopy and Diffraction', published 2002 under ISBN 9780120147656 and ISBN 0120147653.