Transmission Electron Microscopy and Diffractometry of Materials

This introduction presents the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM.James M. Howe is the author of 'Transmission Electron Microscopy and Diffractometry of Materials', published 2001 under ISBN 9783540678410 and ISBN 3540678417.